Charge Loss and Recovery Characteristics of Irradiated Tantalum Capacitors

This paper compares the predictions of an analytical model and the experimental responses of a variety of tantalum capacitors that were exposed to the low energy flash x-ray generator BLACKJACK 3. Also shown are results of a test of the exponential decay rule, together with a table of radiation response parameters which were obtained from high energy electron irradiation. Results show, within the estimated uncertainties of ±30%, confirmation of the exponential decay rule and agreement between the predicted and experimental responses in BLACKJACK 3.