DocumentCode :
831485
Title :
Design and characterization of a fast CMOS multiple linear array imager for nanosecond light pulse detections
Author :
Casadei, Bruno ; Le Normand, Jean-Pierre ; Hu, Y. ; Cunin, B.
Author_Institution :
Lab. d´´Electronique et de Phys. des Syst.s Instrum.aux, Strasbourg, France
Volume :
52
Issue :
6
fYear :
2003
Firstpage :
1892
Lastpage :
1897
Abstract :
Active pixel sensors (APS) technology offers performance competitive with charge-coupled device technology, and it offers advantages in on-chip functionality, system power reduction, cost, and miniaturization. In this paper, we present the design and characterization of a fast CMOS APS imager for high-speed laser detections, which can replace streak cameras. It produces intensity information as a function of one spatial dimension and time (I=f(x,t)) from a pixel array with two spatial dimensions. The time information is obtained for the first prototype camera by delaying successively the integration phase for each pixel of the same row. The different noise sources of the APS sensors, such as shot noise due to the photo sensor, thermal noise, and flicker noise due to the readout transistors, and the photon shot noise are presented in order to determine the fundamental limits of the image sensor. The first prototype fast MOS imager (FAMOSI) consists of 64×64 active pixels. The simulation and experimental results show that a conversion gain of 6.73±0.25 μ V/e- has been obtained with a noise level of 87±3 e- rms. The power consumption of the chip is 25 mW at 50 frames/s. The time resolution is 0.8 ns for this new concept camera.
Keywords :
CMOS image sensors; flicker noise; integrated circuit noise; shot noise; system-on-chip; thermal noise; CMOS imager; active pixel sensors; fast imager; flicker noise; fundamental limits; high-speed laser detections; multiple linear array imager; nanosecond light pulse detections; pixel noise analysis; shot noise; system on chip; thermal noise; time resolution; 1f noise; CMOS image sensors; CMOS technology; Cameras; Image sensors; Optical arrays; Prototypes; Sensor phenomena and characterization; Sensor systems; Thermal sensors;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2003.820500
Filename :
1246566
Link To Document :
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