Title :
Radiation Testing Complementary (Symmetry) Metal Oxide Semi-Conductor (CMOS) Arrays for Satellites
Author :
Matteucci, Albert J. ; Schneider, Marion F.
Author_Institution :
Air Force Weapons Laboratory, Kirtland AFB, N.M.
Keywords :
Annealing; Automatic testing; Circuit testing; Integrated circuit testing; Laboratories; Manufacturing processes; Satellites; Temperature; Test facilities; Weapons;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1977.4329208
