DocumentCode
831610
Title
Coherent transient spectroscopy of excitons in GaAs-AlGaAs quantum wells
Author
Cundiff, S.T. ; Steel, D.G.
Author_Institution
Harrison M. Randall Lab. of Phys., Michigan Univ., Ann Arbor, MI, USA
Volume
28
Issue
10
fYear
1992
fDate
10/1/1992 12:00:00 AM
Firstpage
2423
Lastpage
2433
Abstract
Coherent transient optical spectroscopy techniques provide a means of studying the relaxation of electronic excitations in solids. Using these techniques the authors examine the relaxation of excitons in GaAs-AlGaAs multiple quantum wells at low temperature. Localization of excitons due to interface disorder results in inhomogeneous broadening of the absorption spectrum and relaxation due to migration between localization sites. The temperature dependence and energy dependence of the relaxation indicate the presence of complex scattering mechanisms. The dependence of the optical response on the polarization of the incident excitation fields is shown to result in a dramatic change of the dephasing and broadening characteristics of the optical response. This response is interpreted in terms of the presence of both localized and delocalized excitons. Mechanisms for the polarization dependence are discussed
Keywords
III-V semiconductors; aluminium compounds; excitons; gallium arsenide; interface electron states; multiwave mixing; optical coherent transients; semiconductor quantum wells; GaAs-AlGaAs; GaAs-AlGaAs multiple quantum wells; MQW exciton localisation; absorption spectrum; coherent transient spectroscopy; complex scattering mechanisms; degenerate three pulse TFWM; delocalized excitons; dephasing; electronic excitation relaxation; energy dependence; excitons; inhomogeneous broadening; interface disorder; optical response; polarization; temperature dependence; transient four wave mixing; Excitons; Nonlinear optics; Optical mixing; Optical polarization; Optical pulses; Optical scattering; Physics; Solids; Spectroscopy; Ultrafast optics;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.159549
Filename
159549
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