Title :
A Comparative Evaluation of Integrated Injection Logic
Author :
Raymond, J.P. ; Pease, R.L.
Author_Institution :
Mission Research Corporation La Jolla, California 92037
Abstract :
Radiation effects on integrated injection logic arrays are presented in terms of available data on "conventional" structures and new test data on advanced structures. The advanced structures were developed for improved electrical performance, independent of radiation hardness. These results are used as a basis of reviewing the considerations in hardened I2L development as an LSI technology in comparison to other contemporary LSI technologies.
Keywords :
Degradation; Failure analysis; Ionization; Large scale integration; Logic arrays; Logic testing; Neutrons; Performance evaluation; Radiation effects; Radiation hardening;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1977.4329216
