Title :
An Evaluation of IC EMP Failure Statistics
Author :
Jenkins, R. ; Durgin, David L.
Abstract :
This paper presents the results of an integrated circuit test program to determine the statistics associated with open circuit IC failure voltages. Histograms of open circuit voltage for seven IC types are presented. Comparisons are made between measured and predicted data based on the Jenkins-Durgin model. Goodness of fit tests have been run for several distributions including normal, log normal, Weibull, and exponential. The results of these tests showed no consistantly good fit to any of the distributions.
Keywords :
Circuit testing; EMP radiation effects; Histograms; Integrated circuit measurements; Integrated circuit testing; Predictive models; Statistical analysis; Statistical distributions; Statistics; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1977.4329222
