Polarimetric measurement of nonspecular wave scattering from building surface roughness

Author

Budiarto, Hary ; Horihata, Kenshi ; Haneda, Katsuyuki ; Takada, Jun-ichi

Author_Institution

Tokyo Inst. of Technol., Japan

Volume

2

Issue

1

fYear

2003

fDate

6/25/1905 12:00:00 AM

Firstpage

242

Lastpage

245

Abstract

The paper presents polarimetric measurements of nonspecular scattering from rough building surfaces. Both V-V and V-H polarizations were estimated independently. The superresolution method was applied as an approach to handle the signal parameters of individual incoming waves scattered from rough building surfaces. In order to comprehend the details of microscopic scattering mechanisms, signal parameters are incorporated into the geometrical ray tracing.

Keywords

electromagnetic wave polarisation; electromagnetic wave scattering; microwave propagation; multipath channels; parameter estimation; polarimetry; ray tracing; rough surfaces; surface roughness; 4.85 to 5.05 GHz; ESPRIT; geometrical ray tracing; microscopic scattering mechanisms; multipath propagation; nonspecular wave scattering; polarimetric measurement; radio propagation properties; rough building surfaces; signal parameters; superresolution method; vertical-horizontal polarization; vertical-vertical polarization; Antenna measurements; Electromagnetic scattering; Polarization; Receiving antennas; Rough surfaces; Signal resolution; Surface roughness; Surface waves; Transmitters; Transmitting antennas;

fLanguage

English

Journal_Title

Antennas and Wireless Propagation Letters, IEEE

Publisher

ieee

ISSN

1536-1225

Type

jour

DOI

10.1109/LAWP.2003.820686

Filename

1247436