DocumentCode :
831900
Title :
Energy Deposition Measurement by Thin-Film Resistors
Author :
Roche, Michel ; Bligny, Roger ; Chevallier, Jacque ; Morin, Jeannine ; Musart, Roger
Author_Institution :
Commissariat Ã\xa0 l´´Energie Atomique - Centre d´´Etudes de Valduc B.P. 14 - 21120 Is-sur-Tille - France
Volume :
24
Issue :
6
fYear :
1977
Firstpage :
2487
Lastpage :
2489
Abstract :
We present a method for measuring energy deposition by resistivity variation. This method has been applied to the measurement of an intense x-ray burst and to the diagnosis of a pulsed fast reactor.
Keywords :
Bridge circuits; Electrical resistance measurement; Energy measurement; Power transformer insulation; Probes; Pulse measurements; Resistors; Sputtering; Time factors; Wideband;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1977.4329242
Filename :
4329242
Link To Document :
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