DocumentCode
831900
Title
Energy Deposition Measurement by Thin-Film Resistors
Author
Roche, Michel ; Bligny, Roger ; Chevallier, Jacque ; Morin, Jeannine ; Musart, Roger
Author_Institution
Commissariat Ã\xa0 l´´Energie Atomique - Centre d´´Etudes de Valduc B.P. 14 - 21120 Is-sur-Tille - France
Volume
24
Issue
6
fYear
1977
Firstpage
2487
Lastpage
2489
Abstract
We present a method for measuring energy deposition by resistivity variation. This method has been applied to the measurement of an intense x-ray burst and to the diagnosis of a pulsed fast reactor.
Keywords
Bridge circuits; Electrical resistance measurement; Energy measurement; Power transformer insulation; Probes; Pulse measurements; Resistors; Sputtering; Time factors; Wideband;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1977.4329242
Filename
4329242
Link To Document