DocumentCode :
83209
Title :
Interview
Volume :
50
Issue :
20
fYear :
2014
fDate :
September 25 2014
Firstpage :
1404
Lastpage :
1404
Abstract :
Prof. Jinn-Shyan Wang, of National Chung Cheng University, Taiwan, talks about the research behind the paper ´Sub-threshold SRAM bit cell pnn for VDDmin and power reduction´, page 1427.
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2014.3320
Filename :
6908617
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=83209
