DocumentCode
832220
Title
Magnetic resonance force microscopy
Author
Mounce, Doug
Volume
8
Issue
2
fYear
2005
fDate
6/1/2005 12:00:00 AM
Firstpage
20
Lastpage
26
Abstract
Dan Rugar at IBM used magnetic resonance force microscope (MRFM) technology in the summer of 2004 to detect the signal from a single electron spin (Rugar et al., 2004). This marked a turning point for microscopy since John Sidles invented the MRFM method in the early 1990s (Sidles, 1991). MRFM fills one of the most fundamental gaps in the tools we have for determining the structure of systems and materials with nuclear detection and mapping coordinates at the atomic scale. This article discusses some history of this microscopy, the unique features of the microscope, and the software and hardware necessary for its success.
Keywords
computerised instrumentation; magnetic force microscopy; magnetic resonance; MRFM; magnetic resonance force microscopy; Atomic force microscopy; Crystallography; Electron microscopy; Magnetic force microscopy; Magnetic resonance; Magnetic resonance imaging; Nanobioscience; Nanoscale devices; Nuclear magnetic resonance; Signal detection;
fLanguage
English
Journal_Title
Instrumentation & Measurement Magazine, IEEE
Publisher
ieee
ISSN
1094-6969
Type
jour
DOI
10.1109/MIM.2005.1438840
Filename
1438840
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