• DocumentCode
    832220
  • Title

    Magnetic resonance force microscopy

  • Author

    Mounce, Doug

  • Volume
    8
  • Issue
    2
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    20
  • Lastpage
    26
  • Abstract
    Dan Rugar at IBM used magnetic resonance force microscope (MRFM) technology in the summer of 2004 to detect the signal from a single electron spin (Rugar et al., 2004). This marked a turning point for microscopy since John Sidles invented the MRFM method in the early 1990s (Sidles, 1991). MRFM fills one of the most fundamental gaps in the tools we have for determining the structure of systems and materials with nuclear detection and mapping coordinates at the atomic scale. This article discusses some history of this microscopy, the unique features of the microscope, and the software and hardware necessary for its success.
  • Keywords
    computerised instrumentation; magnetic force microscopy; magnetic resonance; MRFM; magnetic resonance force microscopy; Atomic force microscopy; Crystallography; Electron microscopy; Magnetic force microscopy; Magnetic resonance; Magnetic resonance imaging; Nanobioscience; Nanoscale devices; Nuclear magnetic resonance; Signal detection;
  • fLanguage
    English
  • Journal_Title
    Instrumentation & Measurement Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1094-6969
  • Type

    jour

  • DOI
    10.1109/MIM.2005.1438840
  • Filename
    1438840