fDate :
6/1/2005 12:00:00 AM
Abstract :
Describes the above-named upcoming conference event. May include topics to be covered or calls for papers.
Keywords :
Aerospace electronics; Aerospace testing; Automatic testing; Automotive applications; Foot; Instruments; Sections; Societies; Space technology; Technological innovation;
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
DOI :
10.1109/MIM.2005.1438856
