• DocumentCode
    832384
  • Title

    Laser-fabricated low-loss single-mode waveguiding devices in GaAs

  • Author

    Eldada, Louay ; Ruberto, Mark N. ; Scarmozzino, Robert ; Levy, Miguel ; Osgood, Richard M., Jr.

  • Author_Institution
    Microelectron. Sci. Lab., Columbia Univ., New York, NY, USA
  • Volume
    10
  • Issue
    11
  • fYear
    1992
  • fDate
    11/1/1992 12:00:00 AM
  • Firstpage
    1610
  • Lastpage
    1616
  • Abstract
    A maskless laser etching technique was used to fabricate novel waveguides and waveguiding structures directly into the surface of GaAs/AlGaAs heterostructures. The modal and loss properties of these groove-defined structures have been measured as a function of waveguide geometry, and low-loss single-mode waveguides have been produced. The technique was used to fabricate various passive optical devices in a single processing step. Waveguide bend and branch losses were measured and are comparable to those in conventionally fabricated devices. Experimental results are described by simple theoretical models. The technique is attractive as a prototyping tool for developing and testing new integrated optic circuits
  • Keywords
    aluminium compounds; etching; gallium arsenide; integrated optics; laser beam applications; optical losses; optical waveguides; optical workshop techniques; AlGaAs; GaAs; GaAs-AlGaAs heterostructures; III-V semiconductors; branch losses; groove-defined structures; integrated optic circuits; laser fabricated waveguiding devices; loss properties; low-loss single-mode waveguides; maskless laser etching technique; passive optical devices; prototyping tool; single processing step; surface; theoretical models; waveguide bend losses; waveguide geometry; waveguiding structures; Circuit testing; Etching; Gallium arsenide; Loss measurement; Optical losses; Optical surface waves; Optical waveguide theory; Optical waveguides; Surface waves; Waveguide lasers;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.184900
  • Filename
    184900