DocumentCode :
832401
Title :
Bayesian methods for erasure insertion in frequency-hopping multiple access with Rice selective fading
Author :
De Fina, Silvia
Author_Institution :
Director of Technol., H3G Italia S.p.A, Roma, Italy
Volume :
52
Issue :
6
fYear :
2003
Firstpage :
1616
Lastpage :
1620
Abstract :
A Bayesian decision rule for erasure insertion is derived, assuming frequency-hop multiple-access communications in Rician selective fading. The proposed method is based on a channel-identification approach together with decision feedback. Given the propagation environment under study, which can be deemed typical for broadband mobile systems, the Rice factor, in addition to the channel power delay profile, needs to be estimated by the receiver. Significant performance gain, compared to the simple ratio-threshold test (RTT), can be achieved with the proposed method at the expense of greater complexity, mainly due to the channel-identification requirement. Nevertheless, it is shown that this Bayesian decision rule exhibits high robustness in respect of the joint estimation of the Rice factor and power-delay profile, thus proving its actual applicability in real receivers employing erasure insertion.
Keywords :
Bayes methods; Rician channels; automatic repeat request; broadband networks; channel estimation; computational complexity; decision theory; delay estimation; frequency hop communication; mobile radio; multi-access systems; radio receivers; Bayesian decision rule; Rice factor; Rician fading; Rician selective fading; broadband mobile systems; channel power delay profile; channel-identification; decision feedback; erasure insertion; frequency-hopping multiple access; ratio-threshold test; Bayesian methods; Delay estimation; Fading; Feedback; Frequency; Mobile communication; Performance gain; Propagation delay; Rician channels; Testing;
fLanguage :
English
Journal_Title :
Vehicular Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9545
Type :
jour
DOI :
10.1109/TVT.2003.816619
Filename :
1247818
Link To Document :
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