Title :
Effective Scalable IEEE 1687 Instrumentation Network for Fault Management
Author :
Jutman, Artur ; Devadze, Sergei ; Shibin, Konstantin
Author_Institution :
Testonica Lab., Tallinn, Estonia
Abstract :
The infrastructure of IJTAG can be utilized during operation to detect errors and make appropriate fault handling. This article describes an architecture where error latency and automation are important requirements.
Keywords :
IEEE standards; failure analysis; system-on-chip; IJTAG infrastructure; SoC-wide homogenous infrastructure; automation; error detection; error latency; fault handling; fault management; scalable IEEE 1687 instrumentation network; third-party IP cores; Circuit faults; Fault detection; Fault tolerant systems; Reliability; Scalability; Embedded Instrumentation; Failure resilience; Fault Management; IEEE 1687; IJTAG;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDAT.2013.2278535
