• DocumentCode
    832769
  • Title

    Dependence of current-gain cutoff frequency on gate length in submicron GaInAs/AlInAs MODFETs

  • Author

    Ketterson, A.A. ; Laskar, J. ; Adesida, I. ; Kolodzey, J. ; Aina, O.A. ; Hier, H.

  • Volume
    25
  • Issue
    7
  • fYear
    1989
  • fDate
    3/30/1989 12:00:00 AM
  • Firstpage
    440
  • Lastpage
    442
  • Abstract
    Investigates the gate length (Lg) dependence of the current-gain cutoff frequency fT in lattice-matched GaInAs/AlInAs MODFETs. The transconductance is found to be relatively insensitive to gate length in this submicron regime, while the fT increases with decreasing gate length due to reduced capacitance as dictated by the charge control model. An effective saturation velocity of 1.3*107 cm/s is deduced from the fT-Lg dependence. A maximum fT of 112 GHz is measured on an Lg=0.15 mu m device, limited mainly by parasitic charge in the AlInAs.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; semiconductor technology; solid-state microwave devices; 0.15 micron; 112 GHz; 130 km/s; EHF; GaInAs-AlInAs; HEMTs; MODFETs; capacitance; charge control model; current-gain cutoff frequency; effective saturation velocity; gate length dependence; lattice-matched; parasitic charge; semiconductors; submicron regime; transconductance;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19890302
  • Filename
    18500