DocumentCode
832769
Title
Dependence of current-gain cutoff frequency on gate length in submicron GaInAs/AlInAs MODFETs
Author
Ketterson, A.A. ; Laskar, J. ; Adesida, I. ; Kolodzey, J. ; Aina, O.A. ; Hier, H.
Volume
25
Issue
7
fYear
1989
fDate
3/30/1989 12:00:00 AM
Firstpage
440
Lastpage
442
Abstract
Investigates the gate length (Lg) dependence of the current-gain cutoff frequency fT in lattice-matched GaInAs/AlInAs MODFETs. The transconductance is found to be relatively insensitive to gate length in this submicron regime, while the fT increases with decreasing gate length due to reduced capacitance as dictated by the charge control model. An effective saturation velocity of 1.3*107 cm/s is deduced from the fT-Lg dependence. A maximum fT of 112 GHz is measured on an Lg=0.15 mu m device, limited mainly by parasitic charge in the AlInAs.
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; semiconductor technology; solid-state microwave devices; 0.15 micron; 112 GHz; 130 km/s; EHF; GaInAs-AlInAs; HEMTs; MODFETs; capacitance; charge control model; current-gain cutoff frequency; effective saturation velocity; gate length dependence; lattice-matched; parasitic charge; semiconductors; submicron regime; transconductance;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19890302
Filename
18500
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