DocumentCode :
832769
Title :
Dependence of current-gain cutoff frequency on gate length in submicron GaInAs/AlInAs MODFETs
Author :
Ketterson, A.A. ; Laskar, J. ; Adesida, I. ; Kolodzey, J. ; Aina, O.A. ; Hier, H.
Volume :
25
Issue :
7
fYear :
1989
fDate :
3/30/1989 12:00:00 AM
Firstpage :
440
Lastpage :
442
Abstract :
Investigates the gate length (Lg) dependence of the current-gain cutoff frequency fT in lattice-matched GaInAs/AlInAs MODFETs. The transconductance is found to be relatively insensitive to gate length in this submicron regime, while the fT increases with decreasing gate length due to reduced capacitance as dictated by the charge control model. An effective saturation velocity of 1.3*107 cm/s is deduced from the fT-Lg dependence. A maximum fT of 112 GHz is measured on an Lg=0.15 mu m device, limited mainly by parasitic charge in the AlInAs.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; semiconductor technology; solid-state microwave devices; 0.15 micron; 112 GHz; 130 km/s; EHF; GaInAs-AlInAs; HEMTs; MODFETs; capacitance; charge control model; current-gain cutoff frequency; effective saturation velocity; gate length dependence; lattice-matched; parasitic charge; semiconductors; submicron regime; transconductance;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19890302
Filename :
18500
Link To Document :
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