• DocumentCode
    832780
  • Title

    A modified transverse resonance method for the analysis of multilayered, multiconductor quasiplanar structures with finite conductor thickness and mounting grooves

  • Author

    Tao, Jun-Wu

  • Author_Institution
    Lab. d´´Hyperfrequence et de Caracterisation, Univ. de Savoie, Le Bourget-du-Lac, France
  • Volume
    40
  • Issue
    10
  • fYear
    1992
  • fDate
    10/1/1992 12:00:00 AM
  • Firstpage
    1966
  • Lastpage
    1970
  • Abstract
    A modified transverse resonance method is presented for analyzing generalized multilayered, multiconductor quasiplanar structures with practical parameters such as finite conductor thickness and mounting grooves. Recurrence relations are obtained by using network theory for obtaining the overall transverse equivalent network. while the discontinuity involving the finite-thickness metal sheet and mounting groove is carried out by a field-theory-based multimodal variational formulation. The frequency behaviors of propagating, evanescent, and complex modes are obtained for several commonly used quasiplanar lines, showing good agreement with published results. Furthermore, a leaky-wave study is carried out for open structures, since the open condition can be included in this formulation without difficulties
  • Keywords
    equivalent circuits; microstrip components; resonance; strip line components; variational techniques; complex modes; discontinuity; evanescent modes; finite conductor thickness; leaky-wave study; modified transverse resonance method; mounting grooves; multiconductor quasiplanar structures; multimodal variational formulation; network theory; open structures; propagating modes; recurrence relations; transverse equivalent network; Admittance; Conductors; Frequency; Impedance; Integral equations; Microstrip antennas; Millimeter wave technology; Resonance; Transmission line matrix methods; Waveguide junctions;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.159636
  • Filename
    159636