DocumentCode :
832895
Title :
Noise in mixed continuous-time switched-capacitor sigma-delta modulators
Author :
Dias, V.F. ; Palmisano, G. ; Maloberti, F.
Author_Institution :
Inst. Superior Tecnico, Seccao de Electronica, Lisboa, Portugal
Volume :
139
Issue :
6
fYear :
1992
fDate :
12/1/1992 12:00:00 AM
Firstpage :
680
Lastpage :
684
Abstract :
It is commonly accepted that oversampling/noise-shaping is the most suitable technique for implementing high-resolution data converters in MOS technologies. Most existing modulators use switched-capacitor (SC) techniques because they provide a highly controllable design. When compared to continuous-time (CT) techniques, SC techniques have two main drawbacks: settling time limitation and thermal noise folding. In this paper the performance of mixed continuous-time/switched-capacitor (CT-SC) and SC modulators is compared by analytically evaluating the thermal and jitter noise contributions. Relationships are derived which define the conditions for designing mixed modulators with lower levels of noise power than their SC counterparts. The main conclusion is that in mixed modulators the thermal noise can be significantly reduced, while the jitter noise could be a severe limit on the realisation of high resolution converters
Keywords :
analogue-digital conversion; modulators; random noise; switched capacitor networks; thermal noise; ADC; MOS technologies; continuous-time; high resolution converters; jitter noise; mixed modulators; noise-shaping; oversampling; sigma-delta modulators; switched-capacitor; thermal noise;
fLanguage :
English
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings G
Publisher :
iet
ISSN :
0956-3768
Type :
jour
Filename :
185019
Link To Document :
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