Title :
Experimental Verification of a Stochastic Topology Approach for High-Power Microwave Effects
Author :
Xin Li ; Cui Meng ; Yinong Liu ; Schamiloglu, Edl ; Hemmady, Sameer D.
Author_Institution :
Dept. of Eng. Phys., Tsinghua Univ., Beijing, China
Abstract :
The random coupling model (RCM) and Baum-Liu-Tesche EM topology have been well developed to describe the statistical fluctuation of the scattering and impedance matrices of wave-chaotic metallic-enclosed cavity, and the interaction of interconnected networks of complicated enclosures, respectively. In this paper, a stochastic approach that combines these two methods is tested and verified on a network of wave-chaotic metallic cavities, and induced voltage derived by this method is also compared with other methods.
Keywords :
chaotic communication; electromagnetic wave scattering; impedance matrix; microwave devices; radiofrequency interconnections; stochastic processes; topology; Baum-Liu-Tesche EM topology; RCM; high-power microwave effects; impedance matrices; interconnected network interaction; random coupling model; scattering matrices; statistical fluctuation; stochastic topology approach; wave-chaotic metallic-enclosed cavity; Cavity resonators; Equations; Impedance; Mathematical model; Ports (Computers); Scattering; Transmission line matrix methods; Baum–Liu–Tesche (BLT) equation; Baum???Liu???Tesche (BLT) equation; High-power microwaves (HPM) effects; random coupling model (RCM); statistical electromagnetics; wave chaos;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2014.2384482
