DocumentCode
833099
Title
Amorphous silicon position sensitive neutron detector
Author
Mireshghi, A. ; Cho, G. ; Drewery, J. ; Jing, T. ; Kaplan, S.N. ; Perez-Mendez, V. ; Wildermuth, D.
Author_Institution
Lawrence Berkeley Lab., California Univ., CA, USA
Volume
39
Issue
4
fYear
1992
fDate
8/1/1992 12:00:00 AM
Firstpage
635
Lastpage
640
Abstract
The authors considered the possibility of using an a-Si:H diode, coated with an appropriate converter, as a position-sensitive neutron detector. The Monte Carlo simulation predicted that by using a Gd film, ~2 μm thick, coated on a sufficiently thick amorphous silicon n-i-p diode, a neutron detection efficiency of 25% could be achieved. The experimental results gave an average signal size of about 12000 e- per neutron interaction, which was well above the noise and was in good agreement with the expected values. Pixel detectors can also be fabricated with an element size as small as 300 μm and still register a count rate of 2200 events/s in a typical neutron flux situation of about 107 n/cm2s. These detectors were not sensitive to gamma rays, and showed excellent radiation hardness
Keywords
amorphous semiconductors; neutron detection and measurement; p-i-n diodes; semiconductor counters; silicon; Gd film; Monte Carlo simulation; Si:H; amorphous Si; n-i-p diode; neutron detection efficiency; pixel detector; position-sensitive neutron detector; radiation hardness; Amorphous silicon; Diodes; Event detection; Gamma ray detection; Gamma ray detectors; Gamma rays; Neutrons; Position sensitive particle detectors; Radiation detectors; Semiconductor films;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.159678
Filename
159678
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