• DocumentCode
    833099
  • Title

    Amorphous silicon position sensitive neutron detector

  • Author

    Mireshghi, A. ; Cho, G. ; Drewery, J. ; Jing, T. ; Kaplan, S.N. ; Perez-Mendez, V. ; Wildermuth, D.

  • Author_Institution
    Lawrence Berkeley Lab., California Univ., CA, USA
  • Volume
    39
  • Issue
    4
  • fYear
    1992
  • fDate
    8/1/1992 12:00:00 AM
  • Firstpage
    635
  • Lastpage
    640
  • Abstract
    The authors considered the possibility of using an a-Si:H diode, coated with an appropriate converter, as a position-sensitive neutron detector. The Monte Carlo simulation predicted that by using a Gd film, ~2 μm thick, coated on a sufficiently thick amorphous silicon n-i-p diode, a neutron detection efficiency of 25% could be achieved. The experimental results gave an average signal size of about 12000 e- per neutron interaction, which was well above the noise and was in good agreement with the expected values. Pixel detectors can also be fabricated with an element size as small as 300 μm and still register a count rate of 2200 events/s in a typical neutron flux situation of about 107 n/cm2s. These detectors were not sensitive to gamma rays, and showed excellent radiation hardness
  • Keywords
    amorphous semiconductors; neutron detection and measurement; p-i-n diodes; semiconductor counters; silicon; Gd film; Monte Carlo simulation; Si:H; amorphous Si; n-i-p diode; neutron detection efficiency; pixel detector; position-sensitive neutron detector; radiation hardness; Amorphous silicon; Diodes; Event detection; Gamma ray detection; Gamma ray detectors; Gamma rays; Neutrons; Position sensitive particle detectors; Radiation detectors; Semiconductor films;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.159678
  • Filename
    159678