DocumentCode
83352
Title
Cell-to-Cell Interference Compensation Schemes Using Reduced Symbol Pattern of Interfering Cells for MLC NAND Flash Memory
Author
Taehyung Kim ; Gyuyeol Kong ; Xi Weiya ; Sooyong Choi
Author_Institution
Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
Volume
49
Issue
6
fYear
2013
fDate
Jun-13
Firstpage
2569
Lastpage
2573
Abstract
Cell-to-cell interference compensation schemes using reduced symbol pattern of interfering cells for multilevel cell (MLC) NAND flash memory are proposed in this paper. The proposed schemes consist of three procedures, estimation of cell-to-cell interference, compensation for cell-to-cell interference, and generation of log-likelihood ratio (LLR). First, reduced symbol pattern of interfering cells is used to estimate cell-to-cell interference by modifying the levels of the threshold voltage shift from multi page programming to two levels. Second, based on this estimation, cell-to-cell interference is compensated by modifying the read voltage considering the estimated cell-to-cell interference in the proposed scheme 1 and by subtracting the estimated cell-to-cell interference from the sensed voltage in the proposed scheme 2. Finally, after conducting compensation, LLR is calculated for low-density parity check (LDPC) codes in the assumption of free cell-to-cell interference since interference between cells is mitigated by the compensation procedure. By using these techniques, cell-to-cell interference can be relaxed with a simple structure and a high reliability. The bit error rate (BER) performances of the proposed schemes are compared with the conventional schemes on 8-level MLC NAND flash memory. Simulation results show that the proposed schemes show the improved BER performances by more than an order of magnitude compared with the conventional LDPC scheme.
Keywords
NAND circuits; error statistics; flash memories; parity check codes; reliability; BER performances; LDPC codes; bit error rate performances; cell-cell interference compensation schemes; conventional LDPC scheme; high reliability; log-likelihood ratio; low-density parity check codes; multilevel cell NAND flash memory; multipage programming; read voltage; reduced symbol pattern; threshold voltage shift levels; Cell-to-cell interference; interference compensation; low-density parity check (LDPC); multilevel cell (MLC) NAND flash memory;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2013.2251417
Filename
6522273
Link To Document