• DocumentCode
    83352
  • Title

    Cell-to-Cell Interference Compensation Schemes Using Reduced Symbol Pattern of Interfering Cells for MLC NAND Flash Memory

  • Author

    Taehyung Kim ; Gyuyeol Kong ; Xi Weiya ; Sooyong Choi

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
  • Volume
    49
  • Issue
    6
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    2569
  • Lastpage
    2573
  • Abstract
    Cell-to-cell interference compensation schemes using reduced symbol pattern of interfering cells for multilevel cell (MLC) NAND flash memory are proposed in this paper. The proposed schemes consist of three procedures, estimation of cell-to-cell interference, compensation for cell-to-cell interference, and generation of log-likelihood ratio (LLR). First, reduced symbol pattern of interfering cells is used to estimate cell-to-cell interference by modifying the levels of the threshold voltage shift from multi page programming to two levels. Second, based on this estimation, cell-to-cell interference is compensated by modifying the read voltage considering the estimated cell-to-cell interference in the proposed scheme 1 and by subtracting the estimated cell-to-cell interference from the sensed voltage in the proposed scheme 2. Finally, after conducting compensation, LLR is calculated for low-density parity check (LDPC) codes in the assumption of free cell-to-cell interference since interference between cells is mitigated by the compensation procedure. By using these techniques, cell-to-cell interference can be relaxed with a simple structure and a high reliability. The bit error rate (BER) performances of the proposed schemes are compared with the conventional schemes on 8-level MLC NAND flash memory. Simulation results show that the proposed schemes show the improved BER performances by more than an order of magnitude compared with the conventional LDPC scheme.
  • Keywords
    NAND circuits; error statistics; flash memories; parity check codes; reliability; BER performances; LDPC codes; bit error rate performances; cell-cell interference compensation schemes; conventional LDPC scheme; high reliability; log-likelihood ratio; low-density parity check codes; multilevel cell NAND flash memory; multipage programming; read voltage; reduced symbol pattern; threshold voltage shift levels; Cell-to-cell interference; interference compensation; low-density parity check (LDPC); multilevel cell (MLC) NAND flash memory;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2013.2251417
  • Filename
    6522273