Performance of flash ADCs in the 100 MHz range. II. Results from 8 bit devices

For pt.I see ibid., vol.38, p.102 (1991). Using a test bench that was previously described, the authors have performed tests on 8-b flash analog-to-digital converters (ADCs). For each device they have measured parameters such as linearity, number of effective bits, noise level, aperture jitter, integral and differential nonlinearity, analog bandwidth, and total harmonic distortion. The tests were characterized according to input signal. The tests consisted of sampling the input waveform by taking an event record of up to 2048 consecutive digitizations and then applying the appropriate analysis to this event record. The test results are given