• DocumentCode
    833728
  • Title

    Two CMOS gate arrays for the EPACT experiment

  • Author

    Winkert, George

  • Author_Institution
    NASA/Goddard Space Flight Center, Greenbelt, MD, USA
  • Volume
    39
  • Issue
    4
  • fYear
    1992
  • fDate
    8/1/1992 12:00:00 AM
  • Firstpage
    789
  • Lastpage
    794
  • Abstract
    Two semicustom CMOS digital gate arrays are described which have been developed for the Energetic Particles: Acceleration, Composition, and Transport (EPACT) experiment. The first device, the event counter is 16×24-bit (EC1624), implements sixteen 24-bit ripple counters, and has flexible counting and readout options. The second device, the serial transmitter/receiver (SXR), is a multipersonality chip that can be used at either end of a serial, synchronous communications data link. It can be configured as a master in a central control unit, or as one of many slaves within remote assemblies. Together, a network of SXRs allows for commanding and verification of distributed control signals. Both gate arrays were radiation hardened and qualified for space flight use. The architecture of each chip is presented, and the benefits to the experiment summarized
  • Keywords
    CMOS integrated circuits; distributed control; logic arrays; nuclear electronics; physical instrumentation control; physics computing; CMOS gate arrays; EC1624; EPACT experiment; Energetic Particles: Acceleration, Composition, and Transport; SXR; architecture; central control unit; distributed control signals; event counter; flexible counting; master; multipersonality chip; radiation hardened; readout options; remote assemblies; ripple counters; semicustom CMOS; serial transmitter/receiver; slaves; space flight use; synchronous communications data link; Clocks; Counting circuits; Distributed control; Instruments; Integrated circuit measurements; Pins; Pulse measurements; Radiation detectors; Radiation hardening; Telescopes;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.159708
  • Filename
    159708