Title :
Semiconductor Detector Fabrication Techniques
Author :
Trammell, Rex C.
Author_Institution :
ORTEC Incorporated, 100 Midland Read Oak Ridge, Tennessee 37830 U.S.A.
fDate :
4/1/1978 12:00:00 AM
Keywords :
Contacts; Energy resolution; Fabrication; Gamma ray detection; Gamma ray detectors; Germanium; Semiconductor diodes; Silicon; X-ray detection; X-ray detectors;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1978.4329434
