DocumentCode :
833905
Title :
An unconditionally stable extended (USE) finite-element time-domain solution of active nonlinear microwave circuits using perfectly matched layers
Author :
Tsai, Hsiao-Ping ; Wang, Yuanxun ; Itoh, Tatsuo
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Volume :
50
Issue :
10
fYear :
2002
fDate :
10/1/2002 12:00:00 AM
Firstpage :
2226
Lastpage :
2232
Abstract :
This paper proposes an extension of the unconditionally stable finite-element time-domain (FETD) method for the global electromagnetic analysis of active microwave circuits. This formulation has two advantages. First, the time-step size is no longer governed by the spatial discretization of the mesh, but rather by the Nyquist sampling criterion. Second, the implementation of the truncation by the perfectly matched layers (PML) is straightforward. An anisotropic PML absorbing material is presented for the truncation of FETD lattices. Reflection less than -50 dB is obtained numerically over the entire propagation bandwidth in waveguide and microstrip line. A benchmark test on a microwave amplifier indicates that this extended FETD algorithm is not only superior to finite-difference time-domain-based algorithm in mesh flexibility and simulation accuracy, but also reduces computation time dramatically.
Keywords :
active networks; circuit simulation; equivalent circuits; finite element analysis; microwave amplifiers; microwave circuits; nonlinear network analysis; time-domain analysis; FETD lattices truncation; Nyquist sampling criterion; PML truncation; active nonlinear microwave circuits; anisotropic PML absorbing material; computation time reduction; finite-element time-domain method; global EM analysis; global electromagnetic analysis; mesh flexibility; microstrip line; microwave amplifier; perfectly matched layers; simulation accuracy; time-step size; unconditionally stable FETD method; waveguide; Anisotropic magnetoresistance; Electromagnetic analysis; Finite element methods; Lattices; Microwave circuits; Microwave theory and techniques; Perfectly matched layers; Reflection; Sampling methods; Time domain analysis;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2002.803442
Filename :
1038860
Link To Document :
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