Title :
Transport properties of Nb/yttria-stabilized-zirconia/Nb Josephson junctions
Author :
Lam, Simon K H ; Gnanarajan, Sabaratnasingam
Author_Institution :
Appl. Quantum Syst. Group, CSIRO Ind. Phys., NSW, Australia
fDate :
6/1/2005 12:00:00 AM
Abstract :
Nb/yttria-stabilized zirconia (YSZ)/Nb Josephson junctions have been fabricated. The YSZ interlayer resistivity was found to have values of ∼1 mΩ - m and has a weak temperature dependence. The current-voltage characteristics at temperatures from 4.2 K to values close to the Nb critical temperature of ∼8.0 K have been studied. The junction critical current was found to have an exponential relationship with both the YSZ interlayer length and the temperature. These results are consistent with the predicted behavior of a superconductor-normal metal-superconductor junction due to the proximity effect.
Keywords :
Josephson effect; critical currents; niobium; proximity effect (superconductivity); superconducting junction devices; superconductor-normal-superconductor devices; yttrium compounds; zirconium compounds; 4.2 to 8.0 K; Nb-Y2O3ZrO2-Nb; Nb-YSZ-Nb Josephson junctions; critical temperature; current-voltage characteristics; interlayer resistivity; junction critical current; proximity effect; superconductor-normal metal-superconductor junction; transport properties; weak temperature dependence; yttria-stabilized zirconia; Conductivity; Critical current; Current-voltage characteristics; Electrodes; Josephson junctions; Niobium; Proximity effect; Superconducting devices; Temperature dependence; Tin; High current density; Josephson effect; SNS junctions; YSZ;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2005.849716
