DocumentCode
83412
Title
Role of i-aSi:H Layers in aSi:H/cSi Heterojunction Solar Cells
Author
Hayashi, Yasuhiro ; Debin Li ; Ogura, Akira ; Ohshita, Yoshio
Author_Institution
Semicond. Lab., Toyota Technol. Inst., Nagoya, Japan
Volume
3
Issue
4
fYear
2013
fDate
Oct. 2013
Firstpage
1149
Lastpage
1155
Abstract
The dependence of solar cell parameters on i-aSi:H (non- or lightly-doped hydrogenated amorphous silicon) layer thickness in an aSi:H/cSi (crystalline silicon) heterojunction solar cell was analyzed using numerical simulation. By considering the quantum confinement effect at interfaces between i-aSi:H and cSi, experimental data which had not been explained by simulation could be successfully interpreted. The mechanism of an open-circuit voltage increase was visually presented by analyzing carrier distributions and quasi-Fermi levels near cSi surfaces and in the i-aSi:H layers. The optimized thicknesses of the i-aSi:H layers in both front and rear junctions were suggested to obtain the maximum conversion efficiency. The influences of the quantum confinement effect on the simulation results were discussed.
Keywords
Fermi level; amorphous semiconductors; elemental semiconductors; hydrogen; numerical analysis; semiconductor device models; semiconductor heterojunctions; silicon; solar cells; Si:H-Si; aSi:H/cSi heterojunction solar cells; cSi surfaces; carrier distributions; front junction; i-aSi:H layer thickness; maximum conversion efficiency; numerical simulation; open-circuit voltage; optimized thicknesses; quantum confinement effect; quasiFermi levels; rear junction; solar cell parameters; Amorphous silicon; Crystalline materials; Heterojunctions; Indium tin oxide; Mathematical model; Photovoltaic cells; Short-circuit currents; Substrates; Accumulation layer; conversion efficiency; crystalline silicon; fill factor; heterojunction; hydrogenated amorphous silicon; inversion layer; open-circuit voltage; quantum confinement; short-circuit current; solar cell;
fLanguage
English
Journal_Title
Photovoltaics, IEEE Journal of
Publisher
ieee
ISSN
2156-3381
Type
jour
DOI
10.1109/JPHOTOV.2013.2274616
Filename
6579654
Link To Document