Dispersion characteristics of moderately thick microstrip lines by the spectral domain method

Author

Kollipara, R.T. ; Tripathi, V.K.

Author_Institution

Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA

Volume

2

Issue

3

fYear

1992

fDate

3/1/1992 12:00:00 AM

Firstpage

100

Lastpage

101

Abstract

The influence of the metallization thickness on the propagation characteristics of the microstrip lines is modeled by utilizing the computationally efficient spectral domain method with an approximate Green\´s function. The Green\´s function is based on the current and charge distribution at the top and bottom surfaces of the microstrips. The calculated effective dielectric constants and impedances are plotted for single and coupled microstrip lines as a function of frequency. It is seen that the effective dielectric constants obtained from resonance measurements are in good agreement with the calculated values for moderately thick (t/W>

Keywords

Green´s function methods; dispersion (wave); guided electromagnetic wave propagation; permittivity; strip lines; waveguide theory; approximate Green´s function; charge distribution; coupled lines; current distribution; dispersion characteristics; effective dielectric constants; impedances; metallization thickness; microstrip lines; moderately thick; propagation characteristics; single lines; spectral domain method; Conductors; Couplings; Dielectric constant; Dielectric measurements; Frequency; Metallization; Microstrip; Resonance; Surface impedance; Transmission line matrix methods;

fLanguage

English

Journal_Title

Microwave and Guided Wave Letters, IEEE

Publisher

ieee

ISSN

1051-8207

Type

jour

DOI

10.1109/75.124912

Filename

124912