• DocumentCode
    834288
  • Title

    The Physics of Ion Beam Extraction from an Electron Cyclotron Resonance Ion Source

  • Author

    Spadtke, Peter

  • Author_Institution
    Gesellschaft fur Schwerionenforschung mbH, Darmstadt
  • Volume
    36
  • Issue
    4
  • fYear
    2008
  • Firstpage
    1569
  • Lastpage
    1573
  • Abstract
    The quality of an ion beam is described by the brightness, which is defined as particle density in phase space (in amperes per square millimeter milliradian). This density should remain constant along the accelerator if normalized with respect to the actual particle velocity. Any degradation of phase space due to nonlinear forces will decrease the quality of the ion beam. For that reason, highest interest should be paid to improve the extraction of an ion beam from the ion source plasma as much as possible, because here, the initial value of brightness is determined. For understanding the process of extraction of an ion beam from a plasma generator and for possible improvements of the extraction system, computer simulation codes are helpful; however, a correct model has to be used. The physical model for ECR ion sources which has been used in this 3-D simulation using KOBRA3-INP will be described. Results of simulation achieved with these boundary conditions are then compared with experimentally obtained results to verify the validity of the applied models. Viewing targets, metal targets coated with KaB, BaF, or CsI, have been used to measure the beam profile. The ion beam profile has been measured behind extraction and behind the first active optical element, a solenoid, which can be used for a further diagnostic measurement: the dynamic beam profile.
  • Keywords
    brightness; cyclotron resonance; ion accelerators; ion sources; particle beam diagnostics; particle beam extraction; plasma sources; 3-D simulation; BaF; CsI; ECR ion sources; KOBRA3-INP; brightness; computer simulation codes; diagnostic measurement; dynamic beam profile; electron cyclotron resonance; ion beam extraction; ion beam profile; ion source; ion source plasma; nonlinear forces; particle density; particle velocity; plasma generator; solenoid; Brightness; Cyclotrons; Electron beams; Ion beams; Ion sources; Physics; Plasma accelerators; Plasma simulation; Plasma sources; Resonance; Dynamic profile; ion extraction; plasma; simulation;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2008.928716
  • Filename
    4599098