مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

834318

Title :

Nonequilibrium Radiation Effects in Vlsi

Volume :

Issue :

fYear :

1978

Firstpage :

1144

Lastpage :

1145

Keywords :

Circuit testing; Coupling circuits; Dosimetry; Electron beams; Large scale integration; Radiation effects; Resists; Scanning electron microscopy; Synchrotron radiation; Very large scale integration;

fLanguage :

English

Journal_Title :

Nuclear Science, IEEE Transactions on

Publisher :

ieee

ISSN :

0018-9499

Type :

jour

DOI :

10.1109/TNS.1978.4329492

Filename :

4329492

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=834318