Title :
High-performance antimonide-based heterostructure backward diodes for millimeter-wave detection
Author :
Fay, P. ; Schulman, J.N. ; Thomas, S., III ; Chow, D.H. ; Boegeman, Y.K. ; Holabird, K.S.
Author_Institution :
Dept. of Electr. Eng., Notre Dame Univ., IN, USA
Abstract :
Small-area antimonide-based backward diodes for zero-bias millimeter-wave detection have been fabricated and tested. The devices were fabricated using high-resolution I-line stepper lithography, allowing accurate control of the small device active area required for operation at W-band. The devices exhibit excellent measured performance from 1-110 GHz, with responsivities when driven from a 50-/spl Omega/ source of 2540 V/W at 95 GHz. This translates to a projected responsivity of 11.5 × 103 V/W at 95 GHz for a conjugately matched detector. The compression characteristics of the detectors have been measured, with 1.2 dB of responsivity compression for an input power of 8 μW.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; millimetre wave detectors; millimetre wave diodes; photolithography; tunnel diodes; 1 to 110 GHz; 8 muW; 95 GHz; InAs-AlSb-Al/sub 0.1/Ga/sub 0.9/Sb-GaSb; W-band operation; active area control; compression characteristics; conjugately matched detector; heterostructure backward diodes; high-resolution I-line stepper lithography; input power; millimeter-wave detection; responsivities; responsivity compression; tunnel diodes; zero-bias mm-wave detection; Anodes; Detectors; Fabrication; Lithography; Millimeter wave circuits; Millimeter wave measurements; Millimeter wave technology; Semiconductor diodes; Sensor arrays; Testing;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2002.803760