• DocumentCode
    834520
  • Title

    A Survey of Radiation Hardened Microelectronic Memory Technology

  • Author

    Vail, Patrick J.

  • Author_Institution
    Rome Air Development Center Deputy for Electronic Technology Hanscom AFB MA 01731
  • Volume
    25
  • Issue
    6
  • fYear
    1978
  • Firstpage
    1196
  • Lastpage
    1204
  • Abstract
    A study was performed to identify needed research and development in radiation hardened microelectronic memory technology. A review was made of the requirements for memories, the state-of-the-art of mature memory technologies, the trends in the development of unhardened commercial memory technologies, and the current technology gaps facing memory technologies and their prospects for solution. The main conclusion of the study is that the greatest need is for hardened nonvolatile MNOS and Bubble memories, but that these technologies have many difficult technology gaps to overcome. Strategies for research and development on these technologies are given. If this research and development is successful in overcoming these gaps, the positions of MNOS and bubble memories in both the military and commercial market will be greatly enhanced. The advantages of nonvolatility will insure for these technologies the large production base needed to establish confidence in the use of these memory technologies.
  • Keywords
    Consumer electronics; Costs; Microelectronics; Military computing; Nonvolatile memory; Production; Radiation hardening; Research and development; Solid state circuits; Space technology;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1978.4329513
  • Filename
    4329513