DocumentCode
834520
Title
A Survey of Radiation Hardened Microelectronic Memory Technology
Author
Vail, Patrick J.
Author_Institution
Rome Air Development Center Deputy for Electronic Technology Hanscom AFB MA 01731
Volume
25
Issue
6
fYear
1978
Firstpage
1196
Lastpage
1204
Abstract
A study was performed to identify needed research and development in radiation hardened microelectronic memory technology. A review was made of the requirements for memories, the state-of-the-art of mature memory technologies, the trends in the development of unhardened commercial memory technologies, and the current technology gaps facing memory technologies and their prospects for solution. The main conclusion of the study is that the greatest need is for hardened nonvolatile MNOS and Bubble memories, but that these technologies have many difficult technology gaps to overcome. Strategies for research and development on these technologies are given. If this research and development is successful in overcoming these gaps, the positions of MNOS and bubble memories in both the military and commercial market will be greatly enhanced. The advantages of nonvolatility will insure for these technologies the large production base needed to establish confidence in the use of these memory technologies.
Keywords
Consumer electronics; Costs; Microelectronics; Military computing; Nonvolatile memory; Production; Radiation hardening; Research and development; Solid state circuits; Space technology;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1978.4329513
Filename
4329513
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