Error detection method for RSFQ voltage multipliers using a SQUID detector

Author

Hirayama, Fuminori ; Maezawa, Masaaki ; Suzuki, Motohiro ; Ochiai, Masayuki

Author_Institution

Nat. Inst. of Adv. Ind. Sci. & Technol., Ibaraki, Japan

Volume

15

Issue

2

fYear

2005

fDate

6/1/2005 12:00:00 AM

Firstpage

360

Lastpage

363

Abstract

The voltage multiplier (VM) is a principal component in high-precision digital-to-analog (D/A) converters based on rapid single flux quantum (RSFQ) circuits. Experimental confirmation of correct operation of the VM is important to guarantee the accuracy of the D/A converter. In this study, a circuit for direct comparison of the output voltages of VMs was designed and demonstrated. An on-chip SQUID sensor was utilized to detect the VM errors. Bit error rates of a single-stage VM were successfully measured down to 10^-12 in the constant-voltage regions. A method of detecting errors during transients was also proposed and carried out.

Keywords

SQUIDs; digital-analogue conversion; error detection; error statistics; integrated circuit design; superconducting integrated circuits; voltage multipliers; Josephson junction; RSFQ voltage multipliers; SQUID detector; VM errors; bit error rates; constant-voltage regions; error detection method; high-precision digital-to-analog converters; on-chip SQUID sensor; output voltages; principal component; rapid single flux quantum circuits; single-stage VM; voltage standards; Circuits; Detectors; Inductance; Josephson junctions; SQUIDs; Sensor arrays; Superconducting transmission lines; Virtual manufacturing; Voice mail; Voltage; D/A converter; Josephson junction; flux quantum; voltage multiplier; voltage standards;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2005.849850

Filename

1439650