Title :
The relationship between bit-error rate, operating speed and circuit scale of SFQ circuits
Author :
Terai, Hirotaka ; Hashimoto, Yoshihito ; Yorozu, Shinichi ; Fujimaki, Akira ; Yoshikawa, Nobuyuki ; Wang, Zhen
Author_Institution :
Kansai Adv. Res. Center, Nat. Inst. of Inf. & Commun. Technol., Kobe, Japan
fDate :
6/1/2005 12:00:00 AM
Abstract :
Timing jitter is an important constraint for the performance of SFQ circuits. We focus on the timing jitter in a Josephson transmission line (JTL) that induces timing errors at logic gates. A proper data analysis of 2-bit shift registers gave a jitter value of about 0.08 ps for a single Josephson junction in a JTL powered at a designed bias current. The variations in timing parameters of logic cells also give rise to timing errors. We experimentally determined the timing parameters in several logic cells and found that the deviations between actual and nominal values are within 2 ps. The relationship between the gray zone and circuit scale was estimated by extrapolating the transition curves observed in 2-bit shift registers. The estimated circuit scale was 20,000-100,000 JJs and 1,000 JJs at an operating clock frequency of 20 GHz and 40 GHz, respectively.
Keywords :
Josephson effect; clocks; error statistics; logic gates; superconducting logic circuits; superconducting transmission lines; timing jitter; 2 bit; 2-bit shift registers; 20 GHz; 40 GHz; Josephson transmission line; SFQ circuits; bit error rate; designed bias current; estimated circuit scale; gray zone; logic cells; logic gates; operating clock frequency; operating speed; proper data analysis; single Josephson junction; single-flux-quantum circuit; timing errors; timing jitter; timing parameters; transition curves extrapolation; Bit error rate; Clocks; Data analysis; Distributed parameter circuits; Frequency estimation; Josephson junctions; Logic gates; Power transmission lines; Shift registers; Timing jitter; Bit-error rate; gray zone; single-flux-quantum circuit; timing jitter;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2005.849851