DocumentCode
834616
Title
Activation process-dependent characteristics of novel thermionic oxide cathodes for CRT application
Author
Hashim, Abbass A. ; Barratt, David S. ; Hassan, Aseel K. ; Nabok, Alexei V.
Author_Institution
Centre for Electron. Devices & Mater., Sheffield Hallam Univ., UK
Volume
2
Issue
1
fYear
2006
fDate
3/1/2006 12:00:00 AM
Firstpage
91
Lastpage
97
Abstract
The emission and conductivity characteristics of oxide cathodes depend largely on the activation process. In this paper, the electrical properties of new type of oxide cathodes for cathode ray tube (CRT) application, supplied by LG Philips Displays, have been investigated in relation to different cathode activation regimes. The influence of the activation process over different durations has been investigated. A temperature of T=1425 K was chosen to be higher than the optimum cathode activation temperature (T=1200 K), and the other temperature of T=1125 K was lower than that. The electron activation energy (E) was found to vary in the range from 0.58 to 2.28 eV for cathodes activated at the higher temperature regime, and from 1.08 to 1.9 eV for those activated at the lower temperature regime. Scanning electron microscopy (SEM) and electron diffraction X-ray (EDX) analyses show a structural phase transformation in the oxide material that was activated at 1125 K for a period of 1-12 hours. The SEM mapping shows a large contamination of Ba in the top layer of oxide material. The activator agents tungsten and aluminum are found to penetrate into the BaO/SrO layer in two different ways.
Keywords
X-ray analysis; aluminium; barium; barium compounds; cathode-ray tube displays; electric properties; electron diffraction; phase transformations; scanning electron microscopy; strontium compounds; tungsten; 1125 K; 1200 K; 1425 K; Al; BaO-SrO; CRT application; W; activation process dependent characteristics; activator agents; cathode activation regimes; electrical properties; electron activation energy; electron diffraction X-ray analysis; oxide material; scanning electron microscopy; structural phase transformation; thermionic oxide cathodes; Cathode ray tubes; Ceramics; Computer displays; Conductivity; Costs; Liquid crystal displays; Scanning electron microscopy; Temperature distribution; Thermionic emission; Tungsten; Cathode activation process; cathode ray tube (CRT); cermet oxide; oxide cathode; thermionic cathode;
fLanguage
English
Journal_Title
Display Technology, Journal of
Publisher
ieee
ISSN
1551-319X
Type
jour
DOI
10.1109/JDT.2005.864158
Filename
1597158
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