DocumentCode :
834616
Title :
Activation process-dependent characteristics of novel thermionic oxide cathodes for CRT application
Author :
Hashim, Abbass A. ; Barratt, David S. ; Hassan, Aseel K. ; Nabok, Alexei V.
Author_Institution :
Centre for Electron. Devices & Mater., Sheffield Hallam Univ., UK
Volume :
2
Issue :
1
fYear :
2006
fDate :
3/1/2006 12:00:00 AM
Firstpage :
91
Lastpage :
97
Abstract :
The emission and conductivity characteristics of oxide cathodes depend largely on the activation process. In this paper, the electrical properties of new type of oxide cathodes for cathode ray tube (CRT) application, supplied by LG Philips Displays, have been investigated in relation to different cathode activation regimes. The influence of the activation process over different durations has been investigated. A temperature of T=1425 K was chosen to be higher than the optimum cathode activation temperature (T=1200 K), and the other temperature of T=1125 K was lower than that. The electron activation energy (E) was found to vary in the range from 0.58 to 2.28 eV for cathodes activated at the higher temperature regime, and from 1.08 to 1.9 eV for those activated at the lower temperature regime. Scanning electron microscopy (SEM) and electron diffraction X-ray (EDX) analyses show a structural phase transformation in the oxide material that was activated at 1125 K for a period of 1-12 hours. The SEM mapping shows a large contamination of Ba in the top layer of oxide material. The activator agents tungsten and aluminum are found to penetrate into the BaO/SrO layer in two different ways.
Keywords :
X-ray analysis; aluminium; barium; barium compounds; cathode-ray tube displays; electric properties; electron diffraction; phase transformations; scanning electron microscopy; strontium compounds; tungsten; 1125 K; 1200 K; 1425 K; Al; BaO-SrO; CRT application; W; activation process dependent characteristics; activator agents; cathode activation regimes; electrical properties; electron activation energy; electron diffraction X-ray analysis; oxide material; scanning electron microscopy; structural phase transformation; thermionic oxide cathodes; Cathode ray tubes; Ceramics; Computer displays; Conductivity; Costs; Liquid crystal displays; Scanning electron microscopy; Temperature distribution; Thermionic emission; Tungsten; Cathode activation process; cathode ray tube (CRT); cermet oxide; oxide cathode; thermionic cathode;
fLanguage :
English
Journal_Title :
Display Technology, Journal of
Publisher :
ieee
ISSN :
1551-319X
Type :
jour
DOI :
10.1109/JDT.2005.864158
Filename :
1597158
Link To Document :
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