Title :
Stacked Nb-MoSi2-Nb Josephson junctions for AC voltage standards
Author :
Dresselhaus, Paul D. ; Chong, Yonuk ; Benz, Samuel P.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
6/1/2005 12:00:00 AM
Abstract :
Superconductor-normal metal-superconductor (SNS) Josephson junctions have proven to be a critical technology for voltage standards. NIST has used SNS junctions for both dc and ac programmable voltage standards. Previous devices have used primarily PdAu as a normal-metal barrier material. In this paper we present measurements of circuits having MoSi2 barriers. Stacking enables the junctions to be packed more densely, thus increasing design flexibility and margins for the microwave circuits. In this work, measurements are presented from two- and three-junction stacks for application to ac Josephson voltage standards, which show output voltage and distortion near our best previously published results.
Keywords :
measurement standards; microwave integrated circuits; molybdenum compounds; niobium; superconducting integrated circuits; superconductor-normal-superconductor devices; voltage measurement; AC voltage standards; Nb-MoSi2-Nb; SNS junction devices; ac Josephson voltage standards; circuit measurements; stacked Josephson junctions; superconducting devices; superconductor-normal metal-superconductor Josephson junctions; three-junction stacks; two-junction stacks; Distortion measurement; Flexible printed circuits; Josephson junctions; Microwave circuits; NIST; Stacking; Superconducting devices; Superconducting materials; Superconducting microwave devices; Voltage; Digital-analog conversion; Josephson arrays; superconducting devices; superconducting films; thin film devices;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2005.849871
