Title :
An investigation of the performance of the superconducting HEB mixer as a function of its RF embedding impedance
Author :
Loudkov, D. ; Tong, C.-Y.E. ; Blundell, R. ; Kaurova, N. ; Grishina, E. ; Voronov, B. ; Gol´tsman, G.
Author_Institution :
Harvard-Smithsonian Center for Astrophys., Cambridge, MA, USA
fDate :
6/1/2005 12:00:00 AM
Abstract :
We have conducted an investigation of the optimal embedding impedance for a waveguide superconducting hot-electron bolometric (HEB) mixer. Three mixer chip designs for 800 GHz, offering nominal embedding resistances of 70 Ω, 35 Ω, and 15 Ω, have been developed. We used both High Frequency Structure Simulator (HFSS) software and scale model impedance measurements in the design process. We subsequently fabricated HEB mixers to these designs using 3-4 nm thick NbN thin film. Receiver noise temperature measurements and Fourier Transform Spectrometer (FTS) scans were performed to determine the optimal combination of embedding impedance and normal-state resistance for a 50 Ohm IF load impedance. A receiver noise temperature of 440 K was measured at a local oscillator frequency 850 GHz for a mixer with normal state resistance of 62 Ω incorporated into a circuit offering a nominal embedding impedance of 70 Ω. We conclude from our data that, for low noise operation, the normal state resistance of the HEB mixer element should be close to the embedding impedance of the mixer mount.
Keywords :
electric impedance; integrated circuit design; nanoelectronics; niobium compounds; submillimetre wave integrated circuits; submillimetre wave mixers; superconducting integrated circuits; superconducting mixers; thin film circuits; 15 ohm; 3 to 4 nm; 35 ohm; 440 K; 50 ohm; 62 ohm; 70 ohm; 800 GHz; IF load impedance; NbN; RF embedding impedance; high frequency structure simulator software; hot-electron bolometer mixer; normal-state resistance; optimal embedding impedance; receiver noise temperature; scale model impedance measurements; superconducting HEB mixer; thin film circuits; waveguide superconducting hot-electron bolometric mixer; Chip scale packaging; Circuit noise; Electrochemical impedance spectroscopy; Fourier transforms; Impedance measurement; Process design; Radio frequency; Superconducting device noise; Temperature measurement; Transistors; Embedding impedance; fixed-tuned waveguide receiver; hot-electron bolometer mixer;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2005.849879