Title :
Analysis of strain-induced polarisation-insensitive integrated waveguides fabricated using ion-implantation-induced intermixing
Author :
Djie, H.S. ; Ng, S.L. ; Gunawan, O. ; Dowd, P. ; Aimez, V. ; Beauvais, J. ; Beerens, J.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fDate :
8/1/2002 12:00:00 AM
Abstract :
The interdiffusion effect on the strain build-up and refractive index profile of lattice-matched InGaAs/InGaAsP multiple quantum wells is reported. Interdiffusion is achieved experimentally using low energy (360 keV) arsenic or phosphorus ion-implantation-induced disordering, followed by an annealing step. A model of the interdiffusion process has been developed to analyse the effect of different interdiffusion ratios on the waveguide´s polarisation behaviour through the strain build-up and the refractive index profiles for the transverse electric and transverse magnetic modes. Polarisation-resolved photocurrent absorption measurements of quantum-well waveguide structures have shown that sufficiently high ion implantation doses can lead to the realisation of polarisation-insensitive waveguides at 1.55 μm wavelength operation. Comparison with the modelling results shows that the polarisation-dependent behaviour of the waveguides is best described by a higher interdiffusion ratio for the group V than for the group III atoms
Keywords :
III-V semiconductors; chemical interdiffusion; gallium arsenide; gallium compounds; indium compounds; integrated optics; ion implantation; light polarisation; optical communication equipment; optical fabrication; optical waveguides; semiconductor quantum wells; 1.55 micron; 360 keV; As; InGaAs-InGaAsP; InGaAs/InGaAsP multiple quantum wells; P; annealing step; higher interdiffusion ratio; interdiffusion effect; interdiffusion ratios; ion-implantation-induced intermixing; lattice matched multiple quantum wells; low energy arsenic ion-implantation-induced disordering; low energy phosphorus ion-implantation-induced disordering; polarisation-resolved photocurrent absorption measurements; refractive index profile; strain build-up; strain-induced polarisation-insensitive integrated waveguides fabrication; transverse magnetic modes;
Journal_Title :
Optoelectronics, IEE Proceedings -
DOI :
10.1049/ip-opt:20020528