DocumentCode
835085
Title
Measurements and modeling of phonon cooling by electron-tunneling refrigerators
Author
Miller, N.A. ; Clark, A.M. ; Williams, A. ; Ruggiero, S.T. ; Hilton, G.C. ; Beall, J.A. ; Irwin, K.D. ; Vale, L.R. ; Ullom, J.N.
Author_Institution
Dept. of Phys., Univ. of Colorado, Boulder, CO, USA
Volume
15
Issue
2
fYear
2005
fDate
6/1/2005 12:00:00 AM
Firstpage
556
Lastpage
559
Abstract
We demonstrate cooling of the electrons and phonons of a silicon nitride (Si-N) membrane by solid-state refrigerators based on normal metal/insulator/superconductor (NIS) tunnel junctions. We report a temperature reduction of the Si-N membrane from 260 mK to 240 mK, while the electrons in the normal metal of the refrigerator are cooled to 145 mK. We explain the mechanism for cooling an isolated membrane and make quantitative comparisons between experiment and a finite-element thermal model. The model indicates that increasing the thermal conductivity of the cold-fingers, improving the transparency of the tunnel junctions, and reducing the power load through the membrane will make it possible to cool the membrane from 260 mK to below 170 mK. The refrigeration of a membrane makes it possible to integrate other cryogenic devices that require sub-Kelvin temperatures for optimal performance, such as thin-film sensors. We demonstrate this integration by combining NIS refrigerators with an x-ray Transition-Edge-Sensor (TES).
Keywords
cryogenic electronics; finite element analysis; silicon compounds; superconductive tunnelling; superconductor-insulator-superconductor devices; superconductor-normal-superconductor devices; 145 mK; 170 mK; 260 to 240 mK; NIS tunnel junctions; Si-N; electron cooling; electron-tunneling refrigerators; finite-element thermal model; microrefrigerator; normal metal-insulator-superconductor tunnel junctions; phonon cooling; silicon nitride membrane; solid-state refrigerators; Biomembranes; Cooling; Electrons; Metal-insulator structures; Phonons; Refrigerators; Silicon; Solid state circuits; Temperature sensors; Thermal conductivity; Microrefrigerator; NIS junction; phonon cooling; tunneling;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2005.849917
Filename
1439698
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