• DocumentCode
    835184
  • Title

    X-Ray Dose Enhancement

  • Author

    Chadsey, W.L.

  • Author_Institution
    Physical Sciences Group Science Applications, Inc. 8330 Old Courthouse Road, Suite 510 Vienna, Virginia 22180
  • Volume
    25
  • Issue
    6
  • fYear
    1978
  • Firstpage
    1591
  • Lastpage
    1597
  • Abstract
    A very simple model for the estimation of the x-ray dose enhancement at material interfaces is developed. The model is verified through comparison of estimates with Monte Carlo calculations. Additional Monte Carlo calculations are presented for dose enhancement for several conductor/polyethylene interfaces, for a gold/silicon interface with continuous x-ray spectra, and for a gold/silicon interface with a thin gold layer.
  • Keywords
    Cables; Conducting materials; Electron emission; Gold; Monte Carlo methods; Polyethylene; Prediction algorithms; Radiation effects; Reflection; Silicon;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1978.4329578
  • Filename
    4329578
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=835184