DocumentCode :
835212
Title :
Temperature rise at mirror facet of CW semiconductor lasers
Author :
Yoo, Jay S. ; Lee, Hong H. ; Zory, Peter
Author_Institution :
Dept. of Chem. Eng., Florida Univ., Gainesville, FL, USA
Volume :
28
Issue :
3
fYear :
1992
fDate :
3/1/1992 12:00:00 AM
Firstpage :
635
Lastpage :
639
Abstract :
A relationship is derived for the temperature rise at the mirror facet of semiconductor lasers. The analytical result is based on the model of C.H. Henry et al. (1979) as applied to CW lasers and a thermal model. The effects of active layer length and its thickness, surface recombination velocity, output intensity, and an effective thermal length are delineated for the temperature rise. A comparison with experimental results reported in the literature shows good agreement for the facet temperature rise. A by-product is an approximate relationship for the temperature distribution along the lasing direction
Keywords :
laser accessories; mirrors; semiconductor junction lasers; temperature distribution; thermo-optical effects; active layer length; continuous wave semiconductor lasers; effective thermal length; facet temperature rise; lasing direction; mirror facet; output intensity; surface recombination velocity; temperature distribution; thermal model; thickness; Heat sinks; Heating; Laser modes; Mirrors; Optical pulses; Radiative recombination; Semiconductor lasers; Surface emitting lasers; Surface resistance; Temperature;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.124987
Filename :
124987
Link To Document :
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