DocumentCode :
835259
Title :
Accurate X-Ray Diagnostics of Electron Beam X-Ray Simulators
Author :
Dozier, Charles M. ; Brown, Dennis B. ; Criss, John W. ; Birks, L.S.
Volume :
25
Issue :
6
fYear :
1978
Firstpage :
1634
Lastpage :
1639
Abstract :
An efficient calculational code, FLASH, is being developed to predict accurate x-ray spectral distributions for pulsed, electron-beam x-ray sources. This code uses the x-ray diode voltage and current histories to predict the x-ray spectra on an individual shot basis. Calculated spectra have been compared with experimental spectral measurements for 100, 200, and 1000 kV sources and for Fe, Gd, and Ta targets. Agreement between calculated and measured spectra is within 30 percent on an absolute basis.
Keywords :
Diodes; Electrical resistance measurement; Electron beams; Electronic components; Electronic equipment testing; History; Nuclear power generation; Predictive models; Voltage; Weapons;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1978.4329585
Filename :
4329585
Link To Document :
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