DocumentCode
835259
Title
Accurate X-Ray Diagnostics of Electron Beam X-Ray Simulators
Author
Dozier, Charles M. ; Brown, Dennis B. ; Criss, John W. ; Birks, L.S.
Volume
25
Issue
6
fYear
1978
Firstpage
1634
Lastpage
1639
Abstract
An efficient calculational code, FLASH, is being developed to predict accurate x-ray spectral distributions for pulsed, electron-beam x-ray sources. This code uses the x-ray diode voltage and current histories to predict the x-ray spectra on an individual shot basis. Calculated spectra have been compared with experimental spectral measurements for 100, 200, and 1000 kV sources and for Fe, Gd, and Ta targets. Agreement between calculated and measured spectra is within 30 percent on an absolute basis.
Keywords
Diodes; Electrical resistance measurement; Electron beams; Electronic components; Electronic equipment testing; History; Nuclear power generation; Predictive models; Voltage; Weapons;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1978.4329585
Filename
4329585
Link To Document