• DocumentCode
    835302
  • Title

    Radiation Effects on the Current Densities of Integrated Injection Logic (I2L) Devices

  • Author

    Yang, N.T. ; Chou, H.K. ; Ragonese, L.J.

  • Volume
    25
  • Issue
    6
  • fYear
    1978
  • Firstpage
    1652
  • Lastpage
    1654
  • Abstract
    The variation in current density of Integrated Injection Logic (I2L) as a function of neutron or gamma irradiation was evaluated. The results confirm the previous theoretical predictions in all respects. These results can now be used as a tool for improving radiation-hardened I2L cell designs and to verify analytical predictions.
  • Keywords
    Current density; Current measurement; Density measurement; Integrated circuit measurements; Linear circuits; Logic devices; Neutrons; P-n junctions; Radiation effects; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1978.4329589
  • Filename
    4329589
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=835302