Title :
Radiation Effects on the Current Densities of Integrated Injection Logic (I2L) Devices
Author :
Yang, N.T. ; Chou, H.K. ; Ragonese, L.J.
Abstract :
The variation in current density of Integrated Injection Logic (I2L) as a function of neutron or gamma irradiation was evaluated. The results confirm the previous theoretical predictions in all respects. These results can now be used as a tool for improving radiation-hardened I2L cell designs and to verify analytical predictions.
Keywords :
Current density; Current measurement; Density measurement; Integrated circuit measurements; Linear circuits; Logic devices; Neutrons; P-n junctions; Radiation effects; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1978.4329589
