NDE of defects in Superconducting wires using SQUID microscopy

Author

Lee, Su-Young ; Viswanathan, V. ; Huckans, J. ; Matthews, J. ; Wellstood, F.C.

Author_Institution

Coll. Park, Univ. of Maryland, College Park, MD, USA

Volume

15

Issue

2

fYear

2005

fDate

6/1/2005 12:00:00 AM

Firstpage

707

Lastpage

710

Abstract

Using a scanning Superconducting Quantum Interference Device (SQUID) microscope we have examined small samples of Nb-Ti wire with known defects and a sample with artificial defects. We orient the SQUID to measure the field parallel to the wire, which is near zero unless a defect is present. We also have examined known defects using a multi-channel scanning SQUID microscope. In addition, we have modified the nose cone of our SQUID microscope to enable fast NDE of long wires by positioning a thin tube immediately beneath the SQUID chip, while feeding the wire through the tube.

Keywords

SQUID magnetometers; magnetic field measurement; microscopes; nondestructive testing; superconducting materials; NDE; Nb-Ti wire; SQUID microscopy; multi-channel scanning SQUID microscope; scanning superconducting quantum interference device microscope; superconducting wire; superconducting wires; Copper; Interference; Magnetic field measurement; Magnetic resonance imaging; Microscopy; SQUIDs; Superconducting coils; Superconducting filaments and wires; Superconducting magnets; Superconductivity; MRI; NDE; SQUID; superconducting wire;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2005.850020

Filename

1439736