DocumentCode :
835497
Title :
Selective growth of InAs quantum dots by metalorganic chemical vapor deposition
Author :
Yeoh, Terence S. ; Swint, Reuel B. ; Gaur, Anshu ; Elarde, Victor C. ; Coleman, J.J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Volume :
8
Issue :
4
fYear :
2002
Firstpage :
833
Lastpage :
838
Abstract :
We report results of both strain-driven surface segregation of indium from InGaAs thin films as well as selective area epitaxy of InAs quantum dots using these films. InAs segregation from an underlying InGaAs film allows for preferential growth of quantum dots when additional InAs is deposited. By using standard lithography techniques, a two-step selective growth process for quantum dots is achieved. Furthermore, by utilizing self-assembled nanostructures as a template, selective growth of coalesced wires and dots with 100-nm feature sizes are realized.
Keywords :
III-V semiconductors; MOCVD; indium compounds; nanotechnology; optical films; photolithography; segregation; self-assembly; semiconductor quantum dots; 100 nm; InAs; InAs quantum dots; InGaAs; InGaAs thin films; coalesced dots; coalesced wires; feature sizes; metalorganic chemical vapor deposition; optical films; preferential growth; selective area epitaxy; selective growth; self-assembled nanostructures; standard lithography techniques; strain-driven surface segregation; two-step selective growth process; underlying InGaAs film; Chemical vapor deposition; Epitaxial growth; Indium gallium arsenide; Lithography; Nanostructures; Quantum computing; Quantum dots; Self-assembly; Surface morphology; US Department of Transportation;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/JSTQE.2002.801735
Filename :
1039476
Link To Document :
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