DocumentCode :
835999
Title :
Physics and applications of charged particle beam sources
Author :
Hamilton, Gordon W. ; Bacal, Marthe
Author_Institution :
Lab. du CNRS, Ecole Polytech., Palaiseau, France
Volume :
19
Issue :
6
fYear :
1991
fDate :
12/1/1991 12:00:00 AM
Firstpage :
1143
Lastpage :
1151
Abstract :
The authors review the physics and a few applications of charged particle beam sources, most of which originate from, propagate through, or use as a target, a partially ionized plasma. The authors present the plasma phenomena and plasma conditions which are general to most of the charged particle sources, but also other approaches and the current status of the research. The authors describe the applications of charged particle beam sources using partially ionized plasmas in accelerators and ion implantation. The applications covered are those of accelerator sources and ion implantation
Keywords :
beam handling techniques; ion sources; particle beam diagnostics; plasma applications; plasma diagnostics; plasma production; reviews; accelerators; charged particle beam sources; ion implantation; partially ionized plasma; plasma conditions; plasma phenomena; review; Ionization; Particle beams; Physics; Plasma accelerators; Plasma applications; Plasma density; Plasma immersion ion implantation; Plasma sources; Plasma temperature; Plasma transport processes;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.125037
Filename :
125037
Link To Document :
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