• DocumentCode
    835999
  • Title

    Physics and applications of charged particle beam sources

  • Author

    Hamilton, Gordon W. ; Bacal, Marthe

  • Author_Institution
    Lab. du CNRS, Ecole Polytech., Palaiseau, France
  • Volume
    19
  • Issue
    6
  • fYear
    1991
  • fDate
    12/1/1991 12:00:00 AM
  • Firstpage
    1143
  • Lastpage
    1151
  • Abstract
    The authors review the physics and a few applications of charged particle beam sources, most of which originate from, propagate through, or use as a target, a partially ionized plasma. The authors present the plasma phenomena and plasma conditions which are general to most of the charged particle sources, but also other approaches and the current status of the research. The authors describe the applications of charged particle beam sources using partially ionized plasmas in accelerators and ion implantation. The applications covered are those of accelerator sources and ion implantation
  • Keywords
    beam handling techniques; ion sources; particle beam diagnostics; plasma applications; plasma diagnostics; plasma production; reviews; accelerators; charged particle beam sources; ion implantation; partially ionized plasma; plasma conditions; plasma phenomena; review; Ionization; Particle beams; Physics; Plasma accelerators; Plasma applications; Plasma density; Plasma immersion ion implantation; Plasma sources; Plasma temperature; Plasma transport processes;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.125037
  • Filename
    125037