• DocumentCode
    836175
  • Title

    Optimization of fiber-optic readout of LSO scintillation crystals with acid etching

  • Author

    Strul, D. ; Sutcliffe-Goulden, J. ; Halstead, P. ; Marsden, P.K.

  • Author_Institution
    Clinical PET Centre, King´´s Coll., London, UK
  • Volume
    49
  • Issue
    3
  • fYear
    2002
  • fDate
    6/1/2002 12:00:00 AM
  • Firstpage
    619
  • Lastpage
    623
  • Abstract
    Optimizing the collection of scintillation light is essential for good positron emission tomography scanner performance, and even more so when the crystals are read out through optical fibers. Acid etching has been proposed as a cost-effective alternative to mechanical polishing, but there are discrepancies between the results published so far. The aim of this paper is to gain a better understanding of acid etching and its effects on the light yield, and to assess its application to fiber-optic-based configurations. We have examined the surface state of LSO crystals etched for various times and measured their light output in different configurations, with both direct and fiber-optic readout. Our results indicate that crystal etching is a complex process, where different crystal faces may be etched in different ways. Acid etching always resulted in an improved light yield and energy resolution of the crystals, and was as efficient as, or in many cases superior to, mechanical polishing. While this improvement was somewhat limited for the configurations with direct readout of the crystals we tested, it was much larger for the fiber-optic-based configuration.
  • Keywords
    etching; fibre optic sensors; lutetium compounds; polishing; positron emission tomography; scintillation; solid scintillation detectors; LSO scintillation crystals; LuSiO4O:Ce; acid etching; fiber-optic readout; light yield; mechanical polishing; positron emission tomography; Crystals; Energy resolution; Etching; Optical fibers; Optical microscopy; Optical surface waves; Positron emission tomography; Rough surfaces; Surface roughness; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2002.1039538
  • Filename
    1039538