• DocumentCode
    836451
  • Title

    An Evaluation of Semiconductor Detectors for Positron Tomography

  • Author

    Kaufman, Leon ; Williams, Stephen H. ; Hosier, Kenneth ; Ewins, John H.

  • Author_Institution
    University of California, San Francisco Radiologic Imaging Laboratory South San Francisco, California 94080
  • Volume
    26
  • Issue
    1
  • fYear
    1979
  • Firstpage
    648
  • Lastpage
    653
  • Abstract
    Positron tomography utilizing conventional detector technology realizes images with a spatial resolution that is from 5 to 15 times worse than the spatial resolution achieved in x-ray computerized tomography (CT). The inherently high contrast of radionuclide images (when compared to CT) is then lost, especially when small lesions are sought. A preliminary evaluation indicates that semiconductor detectors offer the potential to yield high sensitivity, high spatial resolution, fast devices capable of imaging over clinically significant areas.
  • Keywords
    Cameras; Computed tomography; Detectors; Energy resolution; High-resolution imaging; Lesions; Light scattering; Positrons; Semiconductor materials; Spatial resolution;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1979.4329702
  • Filename
    4329702