• DocumentCode
    836676
  • Title

    Quench problems of Nb3Sn cosine theta high field dipole model magnets

  • Author

    Yamada, Ryuji ; Wake, Masayoshi

  • Author_Institution
    Fermi Nat. Accel. Lab., USA
  • Volume
    15
  • Issue
    2
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    1140
  • Lastpage
    1143
  • Abstract
    We have developed and tested several cosine theta high field dipole model magnets for accelerator application, utilizing Nb3Sn strands made by MJR method and PIT method. With Rutherford cables made with PIT strand we achieved 10.1 Tesla central field at 2.2 K operation, and 9.5 Tesla at 4.5 K operation. The magnet wound with the MJR cable prematurely quenched at 6.8 Tesla at 4.5 K due to cryo-instability. Typical quench behaviors of these magnets are described for both types of magnets, HFDA-04 of MJR and HFDA-05 of PIT. Their characteristics parameters are compared on deff, RRR, thermal conductivity and others, together with other historical Nb3Sn magnets. It is suggested a larger RRR value is essential for the stability of the epoxy impregnated high field magnets made with high current density strands. It is shown that a magnet with a larger RRR value has a longer MPZ value and more stable, due to its high thermal conductivity and low resistivity.
  • Keywords
    accelerator magnets; niobium alloys; quenching (thermal); superconducting magnets; thermal conductivity; tin alloys; 10.1 T; 2.2 K; 4.5 K; 6.8 T; 9.5 T; HFDA-04; HFDA-05; MJR method; MPZ value; Nb3Sn; PIT method; Rutherford cables; accelerator application; characteristics parameters; cosine theta high field dipole model magnets; cryo-instability; epoxy impregnated high field magnets; high current density strands; quench behaviors; quench problems; thermal conductivity; Accelerator magnets; Cables; Current density; Life estimation; Niobium; Stability; Testing; Thermal conductivity; Tin; Wounds; MJR; PIT; RRR; quench;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2005.849514
  • Filename
    1439842