Oxide-free vertical-cavity surface-emitting lasers with low junction temperature and high drive level

Data are presented showing that lithographic vertical-cavity surface-emitting lasers (VCSELs) produce minimal junction temperature rise compared to oxide VCSELs. Eliminating the thermal block caused by internal oxides combined with improved mirror materials reduces the junction temperature. The elimination of internal oxide, lower junction temperature and reduced internal strain promise increased reliability in the new VCSELs. Power conversion efficiencies in excess of ~50% are reported, even for very small lithographic VCSELs.