Title :
FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System
Author :
Crouch, Alfred L. ; Potter, John C. ; Khoche, Ajay ; Dworak, Jennifer
Abstract :
This article discusses the embedding of a tester on an FPGA, which uses IJTAG to enable flexible and dynamic access to test configurations of the on-chip instruments.
Keywords :
field programmable gate arrays; integrated circuit testing; FPGA-based embedded tester; IJTAG; P1687 command system; control system; dynamic access; flexible access; observe-system; on-chip instruments; test configurations; Built-in self-test; Control systems; Embedded systems; Field programmable gate arrays; Testing; Vectors; ATE Enhancement; Embedded Instrument; Embedded Tester; FPGAcontrolled Test; IJTAG; P1687; P1687 Tester; Protocol-Aware Test; Vector Retargeting;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDAT.2013.2278531
