• DocumentCode
    83681
  • Title

    FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System

  • Author

    Crouch, Alfred L. ; Potter, John C. ; Khoche, Ajay ; Dworak, Jennifer

  • Volume
    30
  • Issue
    5
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    6
  • Lastpage
    14
  • Abstract
    This article discusses the embedding of a tester on an FPGA, which uses IJTAG to enable flexible and dynamic access to test configurations of the on-chip instruments.
  • Keywords
    field programmable gate arrays; integrated circuit testing; FPGA-based embedded tester; IJTAG; P1687 command system; control system; dynamic access; flexible access; observe-system; on-chip instruments; test configurations; Built-in self-test; Control systems; Embedded systems; Field programmable gate arrays; Testing; Vectors; ATE Enhancement; Embedded Instrument; Embedded Tester; FPGAcontrolled Test; IJTAG; P1687; P1687 Tester; Protocol-Aware Test; Vector Retargeting;
  • fLanguage
    English
  • Journal_Title
    Design & Test, IEEE
  • Publisher
    ieee
  • ISSN
    2168-2356
  • Type

    jour

  • DOI
    10.1109/MDAT.2013.2278531
  • Filename
    6579678